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Proceedings Paper

SPICA Mid-infrared Instrument (SMI): technical concepts and scientific capabilities
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Paper Abstract

SMI (SPICA Mid-infrared Instrument) is one of the two focal-plane scientific instruments planned for new SPICA, and the Japanese instrument proposed and managed by a university consortium in Japan. SMI covers the wavelength range of 12 to 36 μm, using the following three spectroscopic channels with unprecedentedly high sensitivities: low-resolution spectroscopy (LRS; R = 50 - 120, 17 - 36 μm), mid-resolution spectroscopy (MRS; R = 1300 - 2300, 18 - 36 μm), and high-resolution spectroscopy (HRS; R = 28000, 12 - 18 μm). The key functions of these channels are high-speed dustband mapping with LRS, high-sensitivity multi-purpose spectral mapping with MRS, and high-resolution molecular-gas spectroscopy with HRS. This paper describes the technical concept and scientific capabilities of SMI.

Paper Details

Date Published: 29 July 2016
PDF: 10 pages
Proc. SPIE 9904, Space Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave, 99042I (29 July 2016); doi: 10.1117/12.2232442
Show Author Affiliations
Hidehiro Kaneda, Nagoya Univ. (Japan)
Daisuke Ishihara, Nagoya Univ. (Japan)
Shinki Oyabu, Nagoya Univ. (Japan)
Mitsuyoshi Yamagishi, Nagoya Univ. (Japan)
Takehiko Wada, Japan Aerospace Exploration Agency (Japan)
Mitsunobu Kawada, Japan Aerospace Exploration Agency (Japan)
Naoki Isobe, Japan Aerospace Exploration Agency (Japan)
Kentaroh Asano, Japan Aerospace Exploration Agency (Japan)
Toyoaki Suzuki, Japan Aerospace Exploration Agency (Japan)
Takao Nakagawa, Japan Aerospace Exploration Agency (Japan)
Hideo Matsuhara, Japan Aerospace Exploration Agency (Japan)
Itsuki Sakon, The Univ. of Tokyo (Japan)
Kohji Tsumura, Tohoku Univ. (Japan)
Hiroshi Shibai, Osaka Univ. (Japan)
Taro Matsuo, Osaka Univ. (Japan)


Published in SPIE Proceedings Vol. 9904:
Space Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave
Howard A. MacEwen; Giovanni G. Fazio; Makenzie Lystrup; Natalie Batalha; Nicholas Siegler; Edward C. Tong, Editor(s)

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