Share Email Print
cover

Proceedings Paper

Fundamental gain in high-contrast imaging with the large binocular telescope interferometer
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Numerical simulations for the Large Binocular Telescope Interferometer have shown a fundamental gain in contrast when using two 8m adaptive optics telescopes instead of one, assuming a high Strehl and a cophasing mode. The global gain is improved by a factor 2 in contrast by using the long exposures and by a factor of 10 in contrast by using the short exposures. Indeed, fringes are still present in the short exposure, contrary to the long exposure where the fringes are blurred. Thus, there is some gain in grouping some short exposures with high gain G. This makes the LBTI well suitable for the Angular Differential Imaging technique. A planet will be alternatively located in the dark fringes (G ≈ 10 to 100) and/or in the dark rings (G ≈ 4 to 20). A rotation of 15° is sufficient to pass through at least one gain zone. The LBTI can provide in the visible wavelengths not only high angular resolution (≈ 6:5mas at 750nm) and high sensitivity (by a factor 4), but also a gain in contrast (by a factor 10 to 100) compared to the stand-alone adaptive optics used on each LBT aperture.

Paper Details

Date Published: 4 August 2016
PDF: 13 pages
Proc. SPIE 9907, Optical and Infrared Interferometry and Imaging V, 99071S (4 August 2016); doi: 10.1117/12.2232061
Show Author Affiliations
Fabien Patru, Osservatorio Astrofisico di Arcetri (Italy)
Simone Esposito, Osservatorio Astrofisico di Arcetri (Italy)
Alfio Puglisi, Osservatorio Astrofisico di Arcetri (Italy)
Armando Riccardi, Osservatorio Astrofisico di Arcetri (Italy)
Enrico Pinna, Osservatorio Astrofisico di Arcetri (Italy)
Carmelo Arcidiacono, Osservatorio Astrofisico di Arcetri (Italy)
John Hill, Large Binocular Telescope Observatory (United States)
Philip Hinz, Large Binocular Telescope Observatory (United States)


Published in SPIE Proceedings Vol. 9907:
Optical and Infrared Interferometry and Imaging V
Fabien Malbet; Michelle J. Creech-Eakman; Peter G. Tuthill, Editor(s)

© SPIE. Terms of Use
Back to Top