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Proceedings Paper

Porous plug phase separator and superfluid film flow suppression system for the soft x-ray spectrometer onboard ASTRO-H
Author(s): Yuichiro Ezoe; Kumi Ishikawa; Ikuyuki Mitsuishi; Takaya Ohashi; Kazuhisa Mitsuda; Ryuichi Fujimoto; Masahide Murakami; Kenichi Kanao; Seiji Yoshida; Shoji Tsunematsu; Michael DiPirro; Peter Shirron
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Paper Abstract

Suppression of super fluid helium flow is critical for the Soft X-ray Spectrometer onboard ASTRO-H (Hitomi). In nominal operation, a small helium gas flow of ~30 μg/s must be safely vented and a super fluid film flow must be sufficiently small <2 μg/s. To achieve a life time of the liquid helium, a porous plug phase separator and a film flow suppression system composed of an orifice, a heat exchanger, and knife edge devices are employed. In this paper, design, on-ground testing results and in-orbit performance of the porous plug and the film flow suppression system are described.

Paper Details

Date Published: 18 July 2016
PDF: 10 pages
Proc. SPIE 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray, 99053P (18 July 2016); doi: 10.1117/12.2231968
Show Author Affiliations
Yuichiro Ezoe, Tokyo Metropolitan Univ. (Japan)
Kumi Ishikawa, Institute of Space and Astronautical Science, Japan Aerospace and Exploration Agency (Japan)
Ikuyuki Mitsuishi, Nagoya Univ. (Japan)
Takaya Ohashi, Tokyo Metropolitan Univ. (Japan)
Kazuhisa Mitsuda, Institute of Space and Astronautical Science, Japan Aerospace and Exploration Agency (Japan)
Ryuichi Fujimoto, Kanazawa Univ. (Japan)
Masahide Murakami, Univ. of Tsukuba (Japan)
Kenichi Kanao, Sumitomo Heavy Industries, Ltd. (Japan)
Seiji Yoshida, Sumitomo Heavy Industries, Ltd. (Japan)
Shoji Tsunematsu, Sumitomo Heavy Industries, Ltd. (Japan)
Michael DiPirro, NASA Goddard Space Flight Ctr. (United States)
Peter Shirron, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 9905:
Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
Jan-Willem A. den Herder; Tadayuki Takahashi; Marshall Bautz, Editor(s)

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