Share Email Print
cover

Proceedings Paper

Recent experiments conducted with the Wide-field imaging interferometry testbed (WIIT)
Author(s): David T. Leisawitz; Roser Juanola-Parramon; Matthew Bolcar; James R. Fienup; Alexander S. Iacchetta; Stephen F. Maher; Stephen A. Rinehart
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The Wide-field Imaging Interferometry Testbed (WIIT) was developed at NASA’s Goddard Space Flight Center to demonstrate and explore the practical limitations inherent in wide field-of-view “double Fourier” (spatio-spectral) interferometry. The testbed delivers high-quality interferometric data and is capable of observing spatially and spectrally complex hyperspectral test scenes. Although WIIT operates at visible wavelengths, by design the data are representative of those from a space-based far-infrared observatory. We used WIIT to observe a calibrated, independently characterized test scene of modest spatial and spectral complexity, and an astronomically realistic test scene of much greater spatial and spectral complexity. This paper describes the experimental setup, summarizes the performance of the testbed, and presents representative data.

Paper Details

Date Published: 4 August 2016
PDF: 5 pages
Proc. SPIE 9907, Optical and Infrared Interferometry and Imaging V, 99070U (4 August 2016); doi: 10.1117/12.2231789
Show Author Affiliations
David T. Leisawitz, NASA Goddard Space Flight Ctr. (United States)
Roser Juanola-Parramon, NASA Goddard Space Flight Ctr. (United States)
Matthew Bolcar, NASA Goddard Space Flight Ctr. (United States)
James R. Fienup, Institute of Optics, Univ. of Rochester (United States)
Alexander S. Iacchetta, Institute of Optics, Univ. of Rochester (United States)
Stephen F. Maher, NASA Goddard Space Flight Ctr. (United States)
SSAI, Inc. (United States)
Stephen A. Rinehart, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 9907:
Optical and Infrared Interferometry and Imaging V
Fabien Malbet; Michelle J. Creech-Eakman; Peter G. Tuthill, Editor(s)

© SPIE. Terms of Use
Back to Top