Share Email Print
cover

Proceedings Paper

Model predictions and observed performance of JWST's cryogenic position metrology system
Author(s): Sharon R. Lunt; David Rhodes; Andrew DiAntonio; John Boland; Conrad Wells; Trevis Gigliotti; Gary Johanning
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The James Webb Space Telescope (JWST) cryogenic testing requires measurement systems that both obtain a very high degree of accuracy and can function in that environment. Close-range photogrammetry was identified as meeting those criteria. Testing the capability of a close-range photogrammetric system prior to its existence is a challenging problem. Computer simulation was chosen over building a scaled mock-up to allow for increased flexibility in testing various configurations. Extensive validation work was done to ensure that the actual as-built system meets accuracy and repeatability requirements. The simulated image data predicted the uncertainty in measurement to be within specification and this prediction was borne out experimentally. Uncertainty at all levels was verified experimentally to be <0.1 mm.

Paper Details

Date Published: 29 July 2016
PDF: 17 pages
Proc. SPIE 9904, Space Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave, 99044C (29 July 2016); doi: 10.1117/12.2231727
Show Author Affiliations
Sharon R. Lunt, Harris Corp. (United States)
David Rhodes, Harris Corp. (United States)
Andrew DiAntonio, Harris Corp. (United States)
John Boland, Harris Corp. (United States)
Conrad Wells, Harris Corp. (United States)
Trevis Gigliotti, Principal Point Geospatial Solutions (Canada)
Gary Johanning, Geodetic Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 9904:
Space Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave
Howard A. MacEwen; Giovanni G. Fazio; Makenzie Lystrup; Natalie Batalha; Nicholas Siegler; Edward C. Tong, Editor(s)

© SPIE. Terms of Use
Back to Top