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Proceedings Paper

The Wide Integral Field Infrared Spectrograph (WIFIS): optomechanical design and development
Author(s): R. Elliot Meyer; Dae-Sik Moon; Suresh Sivanandam; Ke Ma; Chuck Henderson; Basil Blank; Chueh-Yi Chou; Miranda Jarvis; Stephen S. Eikenberry
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Paper Abstract

We present the optomechanical design and development of the Wide Integral Field Infrared Spectrograph (WIFIS). WIFIS will provide an unrivalled integral field size of 20”×50” for a near-infrared (0.9-1.7 μm) integral-field spectrograph at the 2.3-meter Steward Bok telescope. Its main optomechanical system consists of two assemblies: a room-temperature bench housing the majority of the optical components and a cryostat for a field-flattening lens, thermal blocking filter, and detector. Two additional optical subsystems will provide calibration functionality, telescope guiding, and off-axis optical imaging. WIFIS will be a highly competitive instrument for seeing-limited astronomical investigations of the dynamics and chemistry of extended objects in the near-infrared wavebands. WIFIS is expected to be commissioned during the end of 2016 with scientific operations beginning in 2017.

Paper Details

Date Published: 9 August 2016
PDF: 13 pages
Proc. SPIE 9908, Ground-based and Airborne Instrumentation for Astronomy VI, 99083Q (9 August 2016); doi: 10.1117/12.2231260
Show Author Affiliations
R. Elliot Meyer, Univ. of Toronto (Canada)
Dunlap Institute for Astronomy & Astrophysics, Univ. of Toronto
Dae-Sik Moon, Univ. of Toronto (Canada)
Suresh Sivanandam, Univ. of Toronto (Canada)
Dunlap Institute for Astronomy & Astrophysics, Univ. of Toronto
Ke Ma, Univ. of Toronto (Canada)
Chuck Henderson, PulseRay (United States)
Basil Blank, PulseRay (United States)
Chueh-Yi Chou, Institute of Astronomy and Astrophysics (Taiwan)
Miranda Jarvis, Univ. of Toronto (Canada)
Stephen S. Eikenberry, Univ. of Florida (United States)


Published in SPIE Proceedings Vol. 9908:
Ground-based and Airborne Instrumentation for Astronomy VI
Christopher J. Evans; Luc Simard; Hideki Takami, Editor(s)

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