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Proceedings Paper

Characterisation of a turbulent module for the MITHIC high-contrast imaging testbed
Author(s): A. Vigan; M. Postnikova; A. Caillat; J.-F. Sauvage; K. Dohlen; K. El Hadi; T. Fusco; M. Lamb; M. N'Diaye
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Paper Abstract

Future high-contrast imagers on ground-based extremely large telescopes will have to deal with the segmentation of the primary mirrors. Residual phase errors coming from the phase steps at the edges of the segments will have to be minimized in order to reach the highest possible wavefront correction and thus the best contrast performance. To study these effects, we have developed the MITHIC high-contrast testbed, which is designed to test various strategies for wavefront sensing, including the Zernike sensor for Extremely accurate measurements of Low-level Differential Aberrations (ZELDA) and COronagraphic Focal-plane wave-Front Estimation for Exoplanet detection (COFFEE). We recently equipped the bench with a new atmospheric turbulence simulation module that offers both static phase patterns representing segmented primary mirrors and continuous phase strips representing atmospheric turbulence filtered by an AO or an XAO system. We present a characterisation of the module using different instruments and wavefront sensors, and the first coronagraphic measurements obtained on MITHIC.

Paper Details

Date Published: 27 July 2016
PDF: 13 pages
Proc. SPIE 9909, Adaptive Optics Systems V, 99093F (27 July 2016); doi: 10.1117/12.2231101
Show Author Affiliations
A. Vigan, Aix Marseille Univ., CNRS, LAM (France)
M. Postnikova, Aix Marseille Univ., CNRS, LAM (France)
A. Caillat, Aix Marseille Univ., CNRS, LAM (France)
J.-F. Sauvage, Aix Marseille Univ., CNRS, LAM (France)
ONERA (France)
K. Dohlen, Aix Marseille Univ., CNRS, LAM (France)
K. El Hadi, Aix Marseille Univ., CNRS, LAM (France)
T. Fusco, Aix Marseille Univ., CNRS, LAM (France)
ONERA (France)
M. Lamb, Univ. of Victoria (Canada)
M. N'Diaye, Space Telescope Science Institute (United States)

Published in SPIE Proceedings Vol. 9909:
Adaptive Optics Systems V
Enrico Marchetti; Laird M. Close; Jean-Pierre Véran, Editor(s)

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