Share Email Print
cover

Proceedings Paper

Image quality metrics applied to digital pathology
Author(s): Ana Jiménez; Gloria Bueno; Gabriel Cristóbal ; Oscar Déniz; David Toomey; Catherine Conway
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Several full-reference and blind metrics from literature have been tested on a set of digitized pathology slides under different known distortion conditions. Those ones showing the most uniform behavior are presented in this paper. Also, an algorithm that provides a blur map of the whole slide images (WSIs) has been implemented based on one of such methods.

Paper Details

Date Published: 29 April 2016
PDF: 18 pages
Proc. SPIE 9896, Optics, Photonics and Digital Technologies for Imaging Applications IV, 98960S (29 April 2016); doi: 10.1117/12.2230655
Show Author Affiliations
Ana Jiménez, Univ. de Castilla-La Mancha (Spain)
Gloria Bueno, Univ. de Castilla-La Mancha (Spain)
Gabriel Cristóbal , Instituto de Óptica "Daza de Valdés" (Spain)
Oscar Déniz, Univ. de Castilla-La Mancha (Spain)
David Toomey, Leica Biosystems (Ireland)
Catherine Conway, Leica Biosystems (Ireland)


Published in SPIE Proceedings Vol. 9896:
Optics, Photonics and Digital Technologies for Imaging Applications IV
Peter Schelkens; Touradj Ebrahimi; Gabriel Cristóbal; Frédéric Truchetet; Pasi Saarikko, Editor(s)

© SPIE. Terms of Use
Back to Top