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Proceedings Paper

Development of nanostructured antireflection coatings for EO/IR sensor applications
Author(s): Gopal G. Pethuraja; Roger E. Welser; Ashok K. Sood; Harry Efstathiadis; Pradeep Haldar; Priyalal S. Wijewarnasuriya; Nibir K. Dhar
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Paper Abstract

Electro-optical/infrared (EO/IR) nanosensors are being developed for a variety of defense and commercial systems applications. One of the critical technologies that will enhance EO/IR sensor performance is the development of advanced antireflection coatings. In this paper, we review our latest work on high quality nanostructure-based antireflection structures, including recent efforts to deposit nanostructured antireflection coatings on IR substrates. Nanostructured antireflection coatings fabricated via oblique angle deposition are shown to enhance the optical transmission through transparent windows by minimizing reflection losses at the spectral band of interest to less than one percent, a substantial improvement over conventional thin-film antireflection coating technologies. Step-graded antireflection structures also exhibit excellent omnidirectional performance, and have recently been demonstrated with good performance in medium wavelength and long wavelength IR spectral bands.

Paper Details

Date Published: 26 May 2016
PDF: 10 pages
Proc. SPIE 9854, Image Sensing Technologies: Materials, Devices, Systems, and Applications III, 985407 (26 May 2016); doi: 10.1117/12.2229647
Show Author Affiliations
Gopal G. Pethuraja, Magnolia Optical Technologies, Inc. (United States)
Roger E. Welser, Magnolia Optical Technologies, Inc. (United States)
Ashok K. Sood, Magnolia Optical Technologies, Inc. (United States)
Harry Efstathiadis, State Univ. of New York Polytechnic Institute (United States)
Pradeep Haldar, State Univ. of New York Polytechnic Institute (United States)
Priyalal S. Wijewarnasuriya, U.S. Army Research Lab. (United States)
Nibir K. Dhar, U.S. Army Night Vision and Electronic Sensors Directorate (United States)


Published in SPIE Proceedings Vol. 9854:
Image Sensing Technologies: Materials, Devices, Systems, and Applications III
Nibir K. Dhar; Achyut K. Dutta, Editor(s)

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