Share Email Print
cover

Proceedings Paper

Calibrating IR cameras for in-situ temperature measurement during the electron beam melt processing of Inconel 718 and Ti-Al6-V4
Author(s): R. B. Dinwiddie; M. M. Kirka; P. D. Lloyd; R. R. Dehoff; L. E. Lowe; G. S. Marlow
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

High performance mid-wave infrared (IR) cameras are used for in-situ electron beam melt process monitoring and temperature measurements. Since standard factory calibrations are insufficient due to very low transmissions of the leaded glass window required for X-ray absorption, two techniques for temperature calibrations are compared. In-situ measurement of emittance will also be discussed. Ultimately, these imaging systems have the potential for routine use for online quality assurance and feedback control.

Paper Details

Date Published: 8 June 2016
PDF: 11 pages
Proc. SPIE 9861, Thermosense: Thermal Infrared Applications XXXVIII, 986107 (8 June 2016); doi: 10.1117/12.2229070
Show Author Affiliations
R. B. Dinwiddie, Oak Ridge National Lab. (United States)
M. M. Kirka, Oak Ridge National Lab. (United States)
P. D. Lloyd, Oak Ridge National Lab. (United States)
R. R. Dehoff, Oak Ridge National Lab. (United States)
L. E. Lowe, Oak Ridge National Lab. (United States)
G. S. Marlow, Oak Ridge National Lab. (United States)


Published in SPIE Proceedings Vol. 9861:
Thermosense: Thermal Infrared Applications XXXVIII
Joseph N. Zalameda; Paolo Bison, Editor(s)

© SPIE. Terms of Use
Back to Top