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Proceedings Paper

Using luminescent materials as the active element for radiation sensors
Author(s): William A. Hollerman; Ross S. Fontenot; Stephen Williams; John Miller
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Paper Abstract

Ionizing radiation poses a significant challenge for Earth-based defense applications as well as human and/or robotic space missions. Practical sensors based on luminescence will depend heavily upon research investigating the resistance of these materials to ionizing radiation and the ability to anneal or self-heal from damage caused by such radiation. In 1951, Birks and Black showed experimentally that the luminescent efficiency of anthracene bombarded by alphas varies with total fluence (N) as (I/I0) = 1/(1 + AN), where I is the luminescence yield, I0 is the initial yield, and A is a constant. The half brightness (N1/2) is defined as the fluence that reduce the emission light yield to half and is equal to is the inverse of A. Broser and Kallmann developed a similar relationship to the Birks and Black equation for inorganic phosphors irradiated using alpha particles. From 1990 to the present, we found that the Birks and Black relation describes the reduction in light emission yield for every tested luminescent material except lead phosphate glass due to proton irradiation. These results indicate that radiation produced quenching centers compete with emission for absorbed energy. The purpose of this paper is to present results from research completed in this area over the last few years. Particular emphasis will be placed on recent measurements made on new materials such as europium tetrakis dibenzoylmethide triethylammonium (EuD4TEA). Results have shown that EuD4TEA with its relatively small N1/2 might be a good candidate for use as a personal proton fluence sensor.

Paper Details

Date Published: 13 May 2016
PDF: 12 pages
Proc. SPIE 9838, Sensors and Systems for Space Applications IX, 98380Z (13 May 2016); doi: 10.1117/12.2228934
Show Author Affiliations
William A. Hollerman, Univ. of Louisiana at Lafayette (United States)
Ross S. Fontenot, Naval Surface Warfare Ctr. Carderock Div. (United States)
Stephen Williams, Univ. of Louisiana at Lafayette (United States)
John Miller, Univ. of Louisiana at Lafayette (United States)


Published in SPIE Proceedings Vol. 9838:
Sensors and Systems for Space Applications IX
Khanh D. Pham; Genshe Chen, Editor(s)

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