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Proceedings Paper

Fast Hough transform analysis: pattern deviation from line segment
Author(s): E. Ershov; A. Terekhin; D. Nikolaev; V. Postnikov; S. Karpenko
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Paper Abstract

In this paper, we analyze properties of dyadic patterns. These pattern were proposed to approximate line segments in the fast Hough transform (FHT). Initially, these patterns only had recursive computational scheme. We provide simple closed form expression for calculating point coordinates and their deviation from corresponding ideal lines.

Paper Details

Date Published: 8 December 2015
PDF: 5 pages
Proc. SPIE 9875, Eighth International Conference on Machine Vision (ICMV 2015), 987509 (8 December 2015); doi: 10.1117/12.2228852
Show Author Affiliations
E. Ershov, Institute for Information Transmission Problems (Russian Federation)
A. Terekhin, Institute for Information Transmission Problems (Russian Federation)
D. Nikolaev, Institute for Information Transmission Problems (Russian Federation)
V. Postnikov, JSC Cognitive (Russian Federation)
National Univ. of Science and Technology "MISiS" (Russian Federation)
S. Karpenko, Institute for Information Transmission Problems (Russian Federation)


Published in SPIE Proceedings Vol. 9875:
Eighth International Conference on Machine Vision (ICMV 2015)
Antanas Verikas; Petia Radeva; Dmitry Nikolaev, Editor(s)

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