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Proceedings Paper

Calibration of spectral responsivity of IR detectors in the range from 0.6 µm to 24 µm
Author(s): Vyacheslav B. Podobedov; George P. Eppeldauer; Leonard M. Hanssen; Thomas C. Larason
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Paper Abstract

We report the upgraded performance of the National Institute of Standards and Technology (NIST) facility for spectral responsivity calibrations of infrared (IR) detectors in both radiant power and irradiance measurement modes. The extension of the wavelength range of the previous scale, below 0.8 μm and above 19 μm in radiant power mode as well as above 5.3 μm in irradiance mode, became available as a result of multiple improvements. The calibration facility was optimized for low-level radiant flux. A significantly reduced noise-equivalent-power and a relatively constant spectral response were achieved recently on newly developed pyroelectric detectors. Also, an efficient optical geometry was developed for calibration of the spectral irradiance responsivity without using an integrating sphere. Simultaneously, the upgrade and maintenance of the NIST transfer standards, with an extended spectral range, were supported by spectral reflectance measurements of a transfer standard pyroelectric detector using a custom integrating sphere and a Fourier transform spectrometer. The sphere reflectance measurements performed in a relative mode were compared to a bare gold-coated mirror reference, separately calibrated at the Fourier transform Infrared Spectrophotometry facility to 18 μm. Currently, the reflectance data for the pyroelectric standard, available in the range up to 30 μm, are supporting the absolute power responsivity scale by the propagation of the reflectance curve to the absolute tie-spectrum in the overlapping range. Typical examples of working standard pyroelectric-, Si-, MCT-, InSb- and InGaAs- detectors are presented and their optimal use for scale dissemination is analyzed.

Paper Details

Date Published: 20 May 2016
PDF: 11 pages
Proc. SPIE 9819, Infrared Technology and Applications XLII, 98190P (20 May 2016); doi: 10.1117/12.2228384
Show Author Affiliations
Vyacheslav B. Podobedov, National Institute of Standards and Technology (United States)
George P. Eppeldauer, National Institute of Standards and Technology (United States)
Leonard M. Hanssen, National Institute of Standards and Technology (United States)
Thomas C. Larason, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 9819:
Infrared Technology and Applications XLII
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; Paul R. Norton, Editor(s)

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