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Proceedings Paper

Banana orchard inventory using IRS LISS sensors
Author(s): Nilay Nishant; Gargi Upadhayay; S. P. Vyas; K. R. Manjunath
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Paper Abstract

Banana is one of the major crops of India with increasing export potential. It is important to estimate the production and acreage of the crop. Thus, the present study was carried out to evolve a suitable methodology for estimating banana acreage. Area estimation methodology was devised around the fact that unlike other crops, the time of plantation of banana is different for different farmers as per their local practices or conditions. Thus in order to capture the peak signatures, biowindow of 6 months was considered, its NDVI pattern studied and the optimum two months were considered when banana could be distinguished from other competing crops. The final area of banana for the particular growing cycle was computed by integrating the areas of these two months using LISS III data with spatial resolution of 23m. Estimated banana acreage in the three districts were 11857Ha, 15202ha and 11373Ha for Bharuch, Anand and Vadodara respectively with corresponding accuracy of 91.8%, 90% and 88.16%. Study further compared the use of LISS IV data of 5.8m spatial resolution for estimation of banana using object based as well as per-pixel classification and the results were compared with statistical reports for both the approaches. In the current paper we depict the various methodologies to accurately estimate the banana acreage.

Paper Details

Date Published: 30 April 2016
PDF: 11 pages
Proc. SPIE 9880, Multispectral, Hyperspectral, and Ultraspectral Remote Sensing Technology, Techniques and Applications VI, 98800J (30 April 2016); doi: 10.1117/12.2228062
Show Author Affiliations
Nilay Nishant, Space Applications Ctr. (India)
Gargi Upadhayay, Space Applications Ctr. (India)
S. P. Vyas, Space Applications Ctr. (India)
K. R. Manjunath, Space Applications Ctr. (India)

Published in SPIE Proceedings Vol. 9880:
Multispectral, Hyperspectral, and Ultraspectral Remote Sensing Technology, Techniques and Applications VI
Allen M. Larar; Prakash Chauhan; Makoto Suzuki; Jianyu Wang, Editor(s)

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