Share Email Print

Proceedings Paper

Optical bistability in a silicon nitride waveguide grating
Author(s): Subhajit Bej; Janne Laukkanen; Jani Tervo; Yuri P. Svirko; Jari Turunen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Using the Fourier Modal Method for gratings with Kerr media [J. Opt. Soc. Am. B 31, 2371 (2014)] we demonstrate that low energy Optical Bistability for normally incident light field can be observed by strong nonlinear light-matter interactions in a Silicon Nitride waveguide-grating with 2-D periodicity. Finite divergence of the incident light beam has been taken into account in our numerical study and the gratings are designed to observe bistable behavior in direct transmitted light inside the optical telecommunication C-band (1520 nm-1570 nm). The waveguide grating structures are fabricated from PECVD synthesized Silicon Nitride thin film on top of quartz with standard electron beam lithography and reactive ion etching techniques. We aim to demonstrate this phenomenon experimentally using a tunable narrow line-width pulsed laser. Our resonant nanostructures may find applications in free space all-optical information processing and all-optical switching.

Paper Details

Date Published: 27 April 2016
PDF: 10 pages
Proc. SPIE 9894, Nonlinear Optics and its Applications IV, 98940C (27 April 2016); doi: 10.1117/12.2227860
Show Author Affiliations
Subhajit Bej, Univ. of Eastern Finland (Finland)
Janne Laukkanen, Univ. of Eastern Finland (Finland)
Jani Tervo, Univ. of Eastern Finland (Finland)
Yuri P. Svirko, Univ. of Eastern Finland (Finland)
Jari Turunen, Univ. of Eastern Finland (Finland)

Published in SPIE Proceedings Vol. 9894:
Nonlinear Optics and its Applications IV
Benjamin J. Eggleton; Neil G. R. Broderick; Alexander L. Gaeta, Editor(s)

© SPIE. Terms of Use
Back to Top