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Proceedings Paper

Interpretation of the effect of dielectric spacer on the ZnO/Ag structure luminescence intensity
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Paper Abstract

For the analysis of ZnO luminescence and the influence of surface plasmon resonance (SPR) on it the simplified approach is proposed. This approach is based on the set of rate equations (SRE), which describes processes taking part in the luminescence. The SRE includes the set of parameters that describe processes determining luminescence of an investigated sample. The proposed approach gives an opportunity for modeling the dependence of radiation intensity on pumping level and to estimate the values of parameters in SRE. As a result it is possible to make conclusions about peculiarities of samples and investigated processes. A number of experimental facts can be explained using this SRE, in particular the proposed approach was applied to consideration of insulating spacer role in ZnO/Ag system. It was shown that it is possible to interpret experimental results using SRE where values of some parameters depend on the spacer thickness. The proposed approach can be applied not only to ZnO-based structures but also to other emitters.

Paper Details

Date Published: 21 April 2016
PDF: 6 pages
Proc. SPIE 9884, Nanophotonics VI, 98842O (21 April 2016); doi: 10.1117/12.2227398
Show Author Affiliations
A. P. Tarasov, Moscow Institute of Physics and Technology (Russian Federation)
Kotel'nikov Institute of Radio-engineering and Electronics (Russian Federation)
S. I. Rumyantsev, Kotel’nikov Institute of Radio-Engineering and Electronics (Russian Federation)
Ch. M. Briskina, Kotel’nikov Institute of Radio Engineering and Electronics (Russian Federation)
M. V. Ryzhkov, Kotel’nikov Institute of Radio-Engineering and Electronics (Russian Federation)
V. M. Markushev, Kotel’nikov Institute of Radio-Engineering and Electronics (Russian Federation)
A. A. Lotin, The Institute on Laser and Information Technologies (Russian Federation)


Published in SPIE Proceedings Vol. 9884:
Nanophotonics VI
David L. Andrews; Jean-Michel Nunzi; Andreas Ostendorf, Editor(s)

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