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Proceedings Paper

Model development and system performance optimization for staring infrared search and track (IRST) sensors
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Paper Abstract

The mission of an Infrared Search and Track (IRST) system is to detect and locate (sometimes called find and fix) enemy aircraft at significant ranges. Two extreme opposite examples of IRST applications are 1) long range offensive aircraft detection when electronic warfare equipment is jammed, compromised, or intentionally turned off, and 2) distributed aperture systems where enemy aircraft may be in the proximity of the host aircraft. Past IRST systems have been primarily long range offensive systems that were based on the LWIR second generation thermal imager. The new IRST systems are primarily based on staring infrared focal planes and sensors. In the same manner that FLIR92 did not work well in the design of staring infrared cameras (NVTherm was developed to address staring infrared sensor performance), current modeling techniques do not adequately describe the performance of a staring IRST sensor. There are no standard military IRST models (per AFRL and NAVAIR), and each program appears to perform their own modeling. For this reason, L-3 has decided to develop a corporate model, working with AFRL and NAVAIR, for the analysis, design, and evaluation of IRST concepts, programs, and solutions. This paper provides some of the first analyses in the L-3 IRST model development program for the optimization of staring IRST sensors.

Paper Details

Date Published: 4 May 2016
PDF: 10 pages
Proc. SPIE 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII, 98200B (4 May 2016); doi: 10.1117/12.2225862
Show Author Affiliations
Craig Olson, L-3 Sonoma EO (United States)
Michael Theisen, L-3 Sonoma EO (United States)
Teresa Pace, L-3 Communications (United States)
Carl Halford, St. Johns Optical Systems (United States)
Ronald Driggers, St. Johns Optical Systems (United States)


Published in SPIE Proceedings Vol. 9820:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
Gerald C. Holst; Keith A. Krapels, Editor(s)

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