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Proceedings Paper

Ideal system morphology and reflectivity measurements for radiative-transfer model development and validation
Author(s): T. J. Kulp; R. L. Sommers; K. L. Krafcik; B. E. Mills; T. A. Reichardt; J. K. Dorrance; C. F. LaCasse IV; K. H. Fuerschbach; J. Craven
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Paper Abstract

This paper describes measurements being made on a series of material systems for the purpose of developing a radiative-transfer model that describes the reflectance of light by granular solids. It is well recognized that the reflectance spectra of granular materials depend on their intrinsic (n(λ) and k(λ)) and extrinsic (morphological) properties. There is, however, a lack of robust and proven models to relate spectra to these parameters. The described work is being conducted in parallel with a modeling effort1 to address this need. Each follows a common developmental spiral in which material properties are varied and the ability of the model to calculate the effects of the changes are tested. The parameters being varied include particle size/shape, packing density, material birefringence, optical thickness, and spectral contribution of a substrate. It is expected that the outcome of this work will be useful in interpreting reflectance data for hyperspectral imaging (HSI), and for a variety of other areas that rely on it.

Paper Details

Date Published: 17 May 2016
PDF: 8 pages
Proc. SPIE 9840, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXII, 98400H (17 May 2016); doi: 10.1117/12.2224637
Show Author Affiliations
T. J. Kulp, Sandia National Labs. (United States)
R. L. Sommers, Sandia National Labs. (United States)
K. L. Krafcik, Sandia National Labs. (United States)
B. E. Mills, Sandia National Labs. (United States)
T. A. Reichardt, Sandia National Labs. (United States)
J. K. Dorrance, Sandia National Labs. (United States)
C. F. LaCasse IV, Sandia National Labs. (United States)
K. H. Fuerschbach, Sandia National Labs. (United States)
J. Craven, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 9840:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXII
Miguel Velez-Reyes; David W. Messinger, Editor(s)

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