Share Email Print
cover

Proceedings Paper

Development and optimization progress with RICOR cryocoolers for HOT IR detectors
Author(s): Amiram Katz; Zvi Bar Haim; Sergey Riabzev; Victor Segal; Avishai Filis; Dan Gover
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The world growth in research and development of High Operating Temperature (HOT) IR detectors impels the development and optimization of suitable cryocoolers. The current developments at RICOR, which include three different cryocooler models and two new controllers, are focused on the - oriented design process, meaning small Size, low Weight, low Power consumption, improved performance and lower production cost, providing proper cryocoolers for future hand held thermal imagers. This paper shows the progress made during development of “HOT” cryocooler prototypes, engineering pre-production series and qualified production series cryocoolers working at the FPA temperature range of 130 - 200K. The progress with development of electronic control modules providing minimized regulated power consumption is also shown. The progress in development of cryocoolers reliability is also reported in the paper.

Paper Details

Date Published: 17 May 2016
PDF: 13 pages
Proc. SPIE 9821, Tri-Technology Device Refrigeration (TTDR), 98210N (17 May 2016); doi: 10.1117/12.2224447
Show Author Affiliations
Amiram Katz, RICOR Cryogenic & Vacuum Systems (Israel)
Zvi Bar Haim, RICOR Cryogenic & Vacuum Systems (Israel)
Sergey Riabzev, RICOR Cryogenic & Vacuum Systems (Israel)
Victor Segal, RICOR Cryogenic & Vacuum Systems (Israel)
Avishai Filis, RICOR Cryogenic & Vacuum Systems (Israel)
Dan Gover, RICOR Cryogenic & Vacuum Systems (Israel)


Published in SPIE Proceedings Vol. 9821:
Tri-Technology Device Refrigeration (TTDR)
Richard I. Epstein; Bjørn F. Andresen; Markus P. Hehlen; Ingo N. Rühlich; Mansoor Sheik-Bahae; Thomas Fraser, Editor(s)

© SPIE. Terms of Use
Back to Top