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Proceedings Paper

Spectral feature variations in x-ray diffraction imaging systems
Author(s): Scott D. Wolter; Joel A. Greenberg
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Paper Abstract

Materials with different atomic or molecular structures give rise to unique scatter spectra when measured by X-ray diffraction. The details of these spectra, though, can vary based on both intrinsic (e.g., degree of crystallinity or doping) and extrinsic (e.g., pressure or temperature) conditions. While this sensitivity is useful for detailed characterizations of the material properties, these dependences make it difficult to perform more general classification tasks, such as explosives threat detection in aviation security. A number of challenges, therefore, currently exist for reliable substance detection including the similarity in spectral features among some categories of materials combined with spectral feature variations from materials processing and environmental factors. These factors complicate the creation of a material dictionary and the implementation of conventional classification and detection algorithms. Herein, we report on two prominent factors that lead to variations in spectral features: crystalline texture and temperature variations. Spectral feature comparisons between materials categories will be described for solid metallic sheet, aqueous liquids, polymer sheet, and metallic, organic, and inorganic powder specimens. While liquids are largely immune to texture effects, they are susceptible to temperature changes that can modify their density or produce phase changes. We will describe in situ temperature-dependent measurement of aqueous-based commercial goods in the temperature range of -20°C to 35°C.

Paper Details

Date Published: 12 May 2016
PDF: 9 pages
Proc. SPIE 9847, Anomaly Detection and Imaging with X-Rays (ADIX), 98470W (12 May 2016); doi: 10.1117/12.2224171
Show Author Affiliations
Scott D. Wolter, Elon Univ. (United States)
Joel A. Greenberg, Duke Univ. (United States)


Published in SPIE Proceedings Vol. 9847:
Anomaly Detection and Imaging with X-Rays (ADIX)
Amit Ashok; Mark A. Neifeld; Michael E. Gehm, Editor(s)

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