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Proceedings Paper

Detection of metanil yellow contamination in turmeric using FT-Raman and FT-IR spectroscopy
Author(s): Sagar Dhakal; Kuanglin Chao; Jianwei Qin; Moon Kim; Walter Schmidt; Dian Chan
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Paper Abstract

Turmeric is well known for its medicinal value and is often used in Asian cuisine. Economically motivated contamination of turmeric by chemicals such as metanil yellow has been repeatedly reported. Although traditional technologies can detect such contaminants in food, high operational costs and operational complexities have limited their use to the laboratory. This study used Fourier Transform Raman Spectroscopy (FT-Raman) and Fourier Transform - Infrared Spectroscopy (FT-IR) to identify metanil yellow contamination in turmeric powder. Mixtures of metanil yellow in turmeric were prepared at concentrations of 30%, 25%, 20%, 15%, 10%, 5%, 1% and 0.01% (w/w). The FT-Raman and FT-IR spectral signal of pure turmeric powder, pure metanil yellow powder and the 8 sample mixtures were obtained and analyzed independently to identify metanil yellow contamination in turmeric. The results show that FT-Raman spectroscopy and FT-IR spectroscopy can detect metanil yellow mixed with turmeric at concentrations as low as 1% and 5%, respectively, and may be useful for non-destructive detection of adulterated turmeric powder.

Paper Details

Date Published: 17 May 2016
PDF: 9 pages
Proc. SPIE 9864, Sensing for Agriculture and Food Quality and Safety VIII, 98640A (17 May 2016); doi: 10.1117/12.2223957
Show Author Affiliations
Sagar Dhakal, USDA Agricultural Research Service (United States)
Kuanglin Chao, USDA Agricultural Research Service (United States)
Jianwei Qin, USDA Agricultural Research Service (United States)
Moon Kim, USDA Agricultural Research Service (United States)
Walter Schmidt, USDA Agricultural Research Service (United States)
Dian Chan, USDA Agricultural Research Service (United States)


Published in SPIE Proceedings Vol. 9864:
Sensing for Agriculture and Food Quality and Safety VIII
Moon S. Kim; Kuanglin Chao; Bryan A. Chin, Editor(s)

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