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Proceedings Paper

Raman and CT scan mapping of chalcogenide glass diffusion generated gradient index profiles
Author(s): G. P. Lindberg; R. H. Berg; J. Deegan; R. Benson; P. S. Salvaggio; N. Gross; B. A. Weinstein; D. Gibson; S. Bayya; J. Sanghera; V. Nguyen; M. Kotov
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Paper Abstract

Metrology of a gradient index (GRIN) material is non-trivial, especially in the realm of infrared and large refractive index. Traditional methods rely on index matching fluids which are not available for indexes as high as those found in the chalcogenide glasses (2.4-3.2). By diffusing chalcogenide glasses of similar composition one can blend the properties in a continuous way. In an effort to measure this we will present data from both x-ray computed tomography scans (CT scans) and Raman mapping scans of the diffusion profiles. Proof of concept measurements on undiffused bonded sheets of chalcogenide glasses were presented previously. The profiles measured will be of axially stacked sheets of chalcogenide glasses diffused to create a linear GRIN profile and nested tubes of chalcogenide glasses diffused to create a radial parabolic GRIN profile. We will show that the x-ray absorption in the CT scan and the intensity of select Raman peaks spatially measured through the material are indicators of the concentration of the diffusion ions and correlate to the spatial change in refractive index. We will also present finite element modeling (FEM) results and compare them to post precision glass molded (PGM) elements that have undergone CT and Raman mapping.

Paper Details

Date Published: 17 May 2016
PDF: 6 pages
Proc. SPIE 9822, Advanced Optics for Defense Applications: UV through LWIR, 98220W (17 May 2016); doi: 10.1117/12.2223775
Show Author Affiliations
G. P. Lindberg, Rochester Precision Optics, LLC (United States)
R. H. Berg, Rochester Precision Optics, LLC (United States)
J. Deegan, Rochester Precision Optics, LLC (United States)
R. Benson, Rochester Precision Optics, LLC (United States)
P. S. Salvaggio, Rochester Precision Optics, LLC (United States)
N. Gross, Univ. at Buffalo (United States)
B. A. Weinstein, Univ. at Buffalo (United States)
D. Gibson, U.S. Naval Research Lab. (United States)
S. Bayya, U.S. Naval Research Lab. (United States)
J. Sanghera, U.S. Naval Research Lab. (United States)
V. Nguyen, U.S. Naval Research Lab. (United States)
M. Kotov, Sotera Defense Solutions, Inc. (United States)


Published in SPIE Proceedings Vol. 9822:
Advanced Optics for Defense Applications: UV through LWIR
Jay N. Vizgaitis; Bjørn F. Andresen; Peter L. Marasco; Jasbinder S. Sanghera; Miguel P. Snyder, Editor(s)

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