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Proceedings Paper

A novel defect detection technique based on automatic detection of potential background
Author(s): Masoumeh Aminzadeh; Thomas Kurfess
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Paper Abstract

Automated defect detection from optical images is an efficient non-destructive evaluation technique for surface and structure health inspection. Background subtraction is a widely-used technique for automated defect detection. In background subtraction, an image of the part with no defect, called background image, is generated and subtracted from the defective part image; the resulted large differences are then considered as defects. In this paper, a new background generation technique is proposed that allows for efficient defect detection at a low-computational load. In this technique, a defect-free region is generated by approximately locating defects and removing them from the original image. The resulted defect-free region is now used to generate the background. The procedure and performance of the algorithm is illustrated by an example.

Paper Details

Date Published: 1 April 2016
PDF: 7 pages
Proc. SPIE 9805, Health Monitoring of Structural and Biological Systems 2016, 98051Q (1 April 2016); doi: 10.1117/12.2223289
Show Author Affiliations
Masoumeh Aminzadeh, Georgia Institute of Technology (United States)
Thomas Kurfess, Georgia Institute of Technology (United States)


Published in SPIE Proceedings Vol. 9805:
Health Monitoring of Structural and Biological Systems 2016
Tribikram Kundu, Editor(s)

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