Share Email Print
cover

Proceedings Paper

A comparative study of experimental and finite element analysis on submillimeter flaws by laser and ultrasonic excited thermography
Author(s): Hai Zhang; Henrique Fernandes; Lingyao Yu; Ulf Hassler; Marc Genest; François Robitaille; Simon Joncas; Yunlong Sheng; Xavier Maldague
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Stitching is used to reduce dry-core and reinforce T-joint structure. However, it might cause new types of flaws, especially submillimeter flaws. In this paper, new approaches including micro-VT, lock-in micro-LLT and micro-LST based on both lock-in and pulse methods are used to detect submillimeter flaws in stitched CFRP. A comparison of laser excitation thermography and micro-VT on micro-porosities is conducted. Micro-CT is used to validate the infrared results. Then, a finite element analysis (FEA) is performed. The geometrical model needed for finite element discretization was developed from micro-CT measurements. The model is validated for the experimental results. Finally a comprehensive experimental and simulation comparison of micro-LLT and micro-LST based on both lock-in and pulse methods is conducted.

Paper Details

Date Published: 11 May 2016
PDF: 17 pages
Proc. SPIE 9861, Thermosense: Thermal Infrared Applications XXXVIII, 98611A (11 May 2016); doi: 10.1117/12.2223209
Show Author Affiliations
Hai Zhang, Laval Univ. (Canada)
Henrique Fernandes, Laval Univ. (Canada)
Federal Univ. of Uberlandia (Brazil)
Lingyao Yu, Laval Univ. (Canada)
Ulf Hassler, Fraunhofer IIS (Germany)
Marc Genest, National Research Council Canada (Canada)
François Robitaille, Univ. of Ottawa (Canada)
Simon Joncas, École de Technologie Supérieure (Canada)
Yunlong Sheng, Laval Univ. (Canada)
Xavier Maldague, Laval Univ. (Canada)


Published in SPIE Proceedings Vol. 9861:
Thermosense: Thermal Infrared Applications XXXVIII
Joseph N. Zalameda; Paolo Bison, Editor(s)

© SPIE. Terms of Use
Back to Top