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Proceedings Paper

A next generation field-portable goniometer system
Author(s): Justin D. Harms; Charles M. Bachmann; Jason W. Faulring; Andres J. Ruiz Torres
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Paper Abstract

Various field portable goniometers have been designed to capture in-situ measurements of a materials bi-directional reflectance distribution function (BRDF), each with a specific scientific purpose in mind.1-4 The Rochester Institute of Technology's (RIT) Chester F. Carlson Center for Imaging Science recently created a novel instrument incorporating a wide variety of features into one compact apparatus in order to obtain very high accuracy BRDFs of short vegetation and sediments, even in undesirable conditions and austere environments. This next generation system integrates a dual-view design using two VNIR/SWIR pectroradiometers to capture target reflected radiance, as well as incoming radiance, to provide for better optical accuracy when measuring in non-ideal atmospheric conditions or when background illumination effects are non-negligible. The new, fully automated device also features a laser range finder to construct a surface roughness model of the target being measured, which enables the user to include inclination information into BRDF post-processing and further allows for roughness effects to be better studied for radiative transfer modeling. The highly portable design features automatic leveling, a precision engineered frame, and a variable measurement plane that allow for BRDF measurements on rugged, un-even terrain while still maintaining true angular measurements with respect to the target, all without sacrificing measurement speed. Despite the expanded capabilities and dual sensor suite, the system weighs less than 75 kg, which allows for excellent mobility and data collection on soft, silty clay or fine sand.

Paper Details

Date Published: 17 May 2016
PDF: 7 pages
Proc. SPIE 9840, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXII, 98400J (17 May 2016); doi: 10.1117/12.2223180
Show Author Affiliations
Justin D. Harms, Rochester Institute of Technology (United States)
Charles M. Bachmann, Rochester Institute of Technology (United States)
Jason W. Faulring, Under contract to RIT, AppliedLogix, LLC (United States)
Andres J. Ruiz Torres, Rochester Institute of Technology (United States)


Published in SPIE Proceedings Vol. 9840:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXII
Miguel Velez-Reyes; David W. Messinger, Editor(s)

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