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Proceedings Paper

Polarimetric detection to examine the residual am-effect in the waveguide e-o phase modulator
Author(s): Ton Ko; Chen-Hsing Chao; Pai-Sheng Shen; Ching T. Lee
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Paper Abstract

The unwanted amplitude undulation (AM) content in the output of a waveguide E-O phase modulator has been observed. Which would come from either the misaligoment between the polarization analyser azimuth (or birefringent ares of a polarization maintaining fiber,PNF) and the principal aces of the modulator [1] or the inherent multi-modes due to the waveguide structure [2J[31 , or the multiple beam reflections in between both ends of the waveguide. A simple way with the polarimetric detection rather than the usual two or more light paths interferometer has been made in checking with such residual AM-effect. For simplicity, we may ignore the multiple light ref'ections effect which will be small either by the antireflection coating or by liqued cutting of the end facets of guide.

Paper Details

Date Published: 1 July 1990
PDF: 1 pages
Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.22231
Show Author Affiliations
Ton Ko, Chung Shan Institute of Science and Technology (Taiwan)
Chen-Hsing Chao, Chung Shan Institute of Science and Technology (Taiwan)
Pai-Sheng Shen, Chung Shan Institute of Science and Technology (Taiwan)
Ching T. Lee, Chung Shan Institute of Science and Technology (Taiwan)

Published in SPIE Proceedings Vol. 1319:
Optics in Complex Systems
F. Lanzl; H.-J. Preuss; G. Weigelt, Editor(s)

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