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Proceedings Paper

Active thermal NDT: problems and solutions
Author(s): V. P. Vavilov
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Paper Abstract

This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters.

Paper Details

Date Published: 11 May 2016
PDF: 9 pages
Proc. SPIE 9861, Thermosense: Thermal Infrared Applications XXXVIII, 98610I (11 May 2016); doi: 10.1117/12.2222980
Show Author Affiliations
V. P. Vavilov, Tomsk Polytechnic Univ. (Russian Federation)
Tomsk State Univ. (Russian Federation)

Published in SPIE Proceedings Vol. 9861:
Thermosense: Thermal Infrared Applications XXXVIII
Joseph N. Zalameda; Paolo Bison, Editor(s)

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