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Proceedings Paper

Application of parabolic reflector on Raman analysis of gas samples
Author(s): Anlan Yu; Duluo Zuo; Jun Gao; Bin Li; Xingbing Wang
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Paper Abstract

Studies on the application of a parabolic reflector in spontaneous Raman scattering for low background Raman analysis of gas samples are reported. As an effective signal enhancing sample cell, photonic bandgap fiber (HC-PBF) or metallined capillary normally result in a strong continuous background in spectra caused by the strong Raman/fluorescence signal from the silica wall and the polymer protective film. In order to obtain enhanced signal with low background, a specially designed sample cell with double-pass and large collecting solid angle constructed by a parabolic reflector and a planar reflector was applied, of which the optical surfaces had been processed by diamond turning and coated by silver film and protective film of high-purity alumina. The influences of optical structure, polarization characteristic, collecting solid-angle and collecting efficiency of the sample cell on light propagation and signal enhancement were studied. A Raman spectrum of ambient air with signal to background ratio of 94 was acquired with an exposure time of 1 sec by an imaging spectrograph. Besides, the 3σ limits of detection (LOD) of 7 ppm for H2, 8 ppm for CO2 and 12 ppm for CO were also obtained. The sample cell mainly based on parabolic reflector will be helpful for compact and high-sensitive Raman system.

Paper Details

Date Published: 12 May 2016
PDF: 8 pages
Proc. SPIE 9855, Next-Generation Spectroscopic Technologies IX, 98550A (12 May 2016); doi: 10.1117/12.2222778
Show Author Affiliations
Anlan Yu, Huazhong Univ. of Science and Technology (China)
Duluo Zuo, Huazhong Univ. of Science and Technology (China)
Jun Gao, Huazhong Univ. of Science and Technology (China)
Bin Li, Huazhong Univ. of Science and Technology (China)
Xingbing Wang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9855:
Next-Generation Spectroscopic Technologies IX
Mark A. Druy; Richard A. Crocombe, Editor(s)

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