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Proceedings Paper

EUV lithography performance for manufacturing: status and outlook
Author(s): Alberto Pirati; Rudy Peeters; Daniel Smith; Sjoerd Lok; Martijn van Noordenburg; Roderik van Es; Eric Verhoeven; Henk Meijer; Arthur Minnaert; Jan-Willem van der Horst; Hans Meiling; Joerg Mallmann; Christian Wagner; Judon Stoeldraijer; Geert Fisser; Jo Finders; Carmen Zoldesi; Uwe Stamm; Herman Boom; David Brandt; Daniel Brown; Igor Fomenkov; Michael Purvis
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Paper Abstract

NXE:3300B scanners have been operational at customer sites since almost two years, and the NXE:3350B, the 4th generation EUV system, has started shipping at the end of 2015. All these exposure tools operate using MOPA pre-pulse source technology, which enabled significant productivity scaling, demonstrated at customers and at ASML. Having achieved the required throughput to support device development, the main priority of the ASML EUV program has shifted towards improving stability and availability. Continuous progresses in defectivity reduction and in the realization of a reticle pellicle are taking place at increased speed. Today’s overlay and imaging results are in line with the requirements of 7nm logic devices; Matched Machine overlay to ArF immersion below 2.5 nm and full wafer CDU performance of less than 1.0nm are regularly achieved. The realization of an intensity loss-less illuminator and improvements in resist formulation are significant progress towards enabling the use of EUV technology for 5nm logic devices at full productivity. This paper will present an overview of the status of the ASML EUV program and product roadmap by reviewing the current performance and on-going developments in productivity, imaging, overlay and mask defectivity reduction.

Paper Details

Date Published: 18 March 2016
PDF: 15 pages
Proc. SPIE 9776, Extreme Ultraviolet (EUV) Lithography VII, 97760A (18 March 2016); doi: 10.1117/12.2220423
Show Author Affiliations
Alberto Pirati, ASML Netherlands B.V. (Netherlands)
Rudy Peeters, ASML Netherlands B.V. (Netherlands)
Daniel Smith, ASML Netherlands B.V. (Netherlands)
Sjoerd Lok, ASML Netherlands B.V. (Netherlands)
Martijn van Noordenburg, ASML Netherlands B.V. (Netherlands)
Roderik van Es, ASML Netherlands B.V. (Netherlands)
Eric Verhoeven, ASML Netherlands B.V. (Netherlands)
Henk Meijer, ASML Netherlands B.V. (Netherlands)
Arthur Minnaert, ASML Netherlands B.V. (Netherlands)
Jan-Willem van der Horst, ASML Netherlands B.V. (Netherlands)
Hans Meiling, ASML Netherlands B.V. (Netherlands)
Joerg Mallmann, ASML Netherlands B.V. (Netherlands)
Christian Wagner, ASML Netherlands B.V. (Netherlands)
Judon Stoeldraijer, ASML Netherlands B.V. (Netherlands)
Geert Fisser, ASML Netherlands B.V. (Netherlands)
Jo Finders, ASML Netherlands B.V. (Netherlands)
Carmen Zoldesi, ASML Netherlands B.V. (Netherlands)
Uwe Stamm, ASML Netherlands B.V. (Netherlands)
Herman Boom, ASML Netherlands B.V. (Netherlands)
David Brandt, ASML Netherlands B.V. (United States)
Daniel Brown, ASML Netherlands B.V. (United States)
Igor Fomenkov, ASML Netherlands B.V. (United States)
Michael Purvis, ASML Netherlands B.V. (United States)


Published in SPIE Proceedings Vol. 9776:
Extreme Ultraviolet (EUV) Lithography VII
Eric M. Panning, Editor(s)

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