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Proceedings Paper

Quality assessment of layer-structured semiconductor single crystals by nuclear quadruple resonance method
Author(s): Andriy Samila; Alexander Khandozhko; Galina Lastivka; Leonid Politansky; Victor Khandozhko
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Paper Abstract

A method for quality assessment of layer-structured semiconductor single crystals (InSe, GaSe, GaS) grown in evacuated ampoules by the Bridgman technique is proposed. For this purpose, nuclear quadruple resonance method with a consecutive scanning of the entire sample volume and evaluation of crystal perfection by the resulting spectra is used. Effective interaction between high-frequency field and crystal and, accordingly, restriction of scanning area of sample under study is provided with the use of a two-way saddle-shaped coil for a nuclear quadruple resonance spectrometer.

Paper Details

Date Published: 30 November 2015
PDF: 4 pages
Proc. SPIE 9809, Twelfth International Conference on Correlation Optics, 98090O (30 November 2015); doi: 10.1117/12.2220289
Show Author Affiliations
Andriy Samila, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Alexander Khandozhko, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Galina Lastivka, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Leonid Politansky, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Victor Khandozhko, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 9809:
Twelfth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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