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Proceedings Paper

Detailed analysis of an optimized FPP-based 3D imaging system
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Paper Abstract

In this paper, we present detail analysis and a step-by-step implementation of an optimized fringe projection profilometry (FPP) based 3D shape measurement system. First, we propose a multi-frequency and multi-phase shifting sinusoidal fringe pattern reconstruction approach to increase accuracy and sensitivity of the system. Second, phase error compensation caused by the nonlinear transfer function of the projector and camera is performed through polynomial approximation. Third, phase unwrapping is performed using spatial and temporal techniques and the tradeoff between processing speed and high accuracy is discussed in details. Fourth, generalized camera and system calibration are developed for phase to real world coordinate transformation. The calibration coefficients are estimated accurately using a reference plane and several gauge blocks with precisely known heights and by employing a nonlinear least square fitting method. Fifth, a texture will be attached to the height profile by registering a 2D real photo to the 3D height map. The last step is to perform 3D image fusion and registration using an iterative closest point (ICP) algorithm for a full field of view reconstruction. The system is experimentally constructed using compact, portable, and low cost off-the-shelf components. A MATLAB® based GUI is developed to control and synchronize the whole system.

Paper Details

Date Published: 19 May 2016
PDF: 11 pages
Proc. SPIE 9868, Dimensional Optical Metrology and Inspection for Practical Applications V, 986802 (19 May 2016); doi: 10.1117/12.2220265
Show Author Affiliations
Dat Tran, The Catholic Univ. of America (United States)
Anh Thai, The Catholic Univ. of America (United States)
Kiet Duong, The Catholic Univ. of America (United States)
Thanh Nguyen, The Catholic Univ. of America (United States)
Georges Nehmetallah, The Catholic Univ. of America (United States)


Published in SPIE Proceedings Vol. 9868:
Dimensional Optical Metrology and Inspection for Practical Applications V
Kevin G. Harding; Song Zhang, Editor(s)

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