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Proceedings Paper

SLM-based tomography of phase objects using single-shot transport of intensity technique
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Paper Abstract

Interferometric based techniques are often used for 3D quantitative phase imaging. While these techniques are sensitive to vibrations, non-interferometric intensity based techniques such as the transport of intensity equation (TIE) do not suffer from such a drawback. Phase reconstruction of phase objects using TIE technique is accomplished by recording several diffraction patterns at different observation planes through axially translating the CCD. In this paper, we purpose to use a spatial light modulator (SLM) in a modified 4f TIE optical setup to acquire 3D tomographic images of phase objects. This modified setup will reduce the acquisition time dramatically making the TIE technique useful for dynamic events such as biological samples. We illustrate how 3D phase objects can be reconstructed tomographically by constructing a rotating mechanism for the sample. At each angle of rotation, two diffraction patterns are captured by the CCD either sequentially or instantaneously with the help of a reference mirror. The reconstructed optical fields are tomographically recomposed to yield the final 3D shape using a tomographic backprojection technique. Finally, a reconfigurable hardware controlled by a GUI is employed to synchronize the CCD, the SLM and the rotating stage.

Paper Details

Date Published: 19 May 2016
PDF: 7 pages
Proc. SPIE 9868, Dimensional Optical Metrology and Inspection for Practical Applications V, 98680H (19 May 2016); doi: 10.1117/12.2220261
Show Author Affiliations
Georges Nehmetallah, The Catholic Univ. of America (United States)
Thanh C. Nguyen, The Catholic Univ. of America (United States)
Dat Tran, The Catholic Univ. of America (United States)
Ahmad Darudi, Univ. of Zanjan (Iran, Islamic Republic of)
Peyman Soltani, Univ. of Zanjan (Iran, Islamic Republic of)


Published in SPIE Proceedings Vol. 9868:
Dimensional Optical Metrology and Inspection for Practical Applications V
Kevin G. Harding; Song Zhang, Editor(s)

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