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Proceedings Paper

Efficient polarization of high-angular-momentum systems
Author(s): Simon Rochester; Szymon Pustelny; Konrad Szymański; Mark Raizen; Marcis Auzinsh; Dmitry Budker
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Paper Abstract

We present a novel technique of efficient optical pumping of open, high-angular-momentum systems. The method combines two well-established approaches of population manipulation (conventional optical pumping and coherent population transfer), offering the ability to achieve higher population of a sublevel with the highest or lowest quantum number m (the “end state”) than obtainable with either of the techniques. To accomplish this task, we propose to use coherent-population-transfer technique (e.g., adiabatic fast passage) to arrange the system in such a way that spontaneously emitted photon (conventional optical pumping) carries away more entropy than in conventional schemes. This enables reduction of a number of spontaneous decays Nsd required to pump the system with the total angular momentum J from Nsd = J decays in the conventional scheme to Nsd ≲ log2(2J) decays in the proposed scheme. Since each spontaneous-emission event is potentially burdened with a loss of population (population is transferred to a dark state), this enables increasing population accumulated in the “end state”, which is important for many applications.

Paper Details

Date Published: 8 March 2016
PDF: 7 pages
Proc. SPIE 9763, Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX, 97630D (8 March 2016); doi: 10.1117/12.2220208
Show Author Affiliations
Simon Rochester, Rochester Scientific, LLC (United States)
Szymon Pustelny, Jagiellonian Univ. in Krakow (Poland)
Konrad Szymański, Jagiellonian Univ. in Krakow (Poland)
Mark Raizen, The Univ. of Texas at Austin (United States)
Marcis Auzinsh, Univ. of Latvia (Latvia)
Dmitry Budker, Helmholtz Institut, Johannes Gutenberg Univ. (Germany)
Univ. of California, Berkeley (United States)
Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 9763:
Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX
Selim M. Shahriar; Jacob Scheuer, Editor(s)

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