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Proceedings Paper

Mueller matrix ellipsometry: a powerful tool for nondestructive characterization of nanostructures
Author(s): Shiyuan Liu; Xiuguo Chen; Chuanwei Zhang; Hao Jiang
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Proc. SPIE 9804, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure 2016, 98041B; doi: 10.1117/12.2219119
Show Author Affiliations
Shiyuan Liu, Huazhong Univ. of Science and Technology (China)
Xiuguo Chen, Huazhong Univ. of Science and Technology (China)
Chuanwei Zhang, Huazhong Univ. of Science and Technology (China)
Hao Jiang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9804:
Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure 2016
Tzuyang Yu; Andrew L. Gyekenyesi; Peter J. Shull; H. Felix Wu, Editor(s)

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