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Proceedings Paper

Magnetic field effects of Rydberg Excitons in Cu2O
Author(s): J. Thewes; J. Heckötter; M. Aßmann; D. Fröhlich; P. Grünwald; S. Scheel; M. Bayer
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Paper Abstract

Rydberg excitons are semiconductor analogues to Rydberg atoms, where one electron is promoted to an energy level of large principal quantum number η and which behave in a manner similar to hydrogen. Their huge spatial extent results in giant dipole moments and interaction effects, which can be used to create nonlinearities at the single excitation level. In contrast to hydrogen, the effective masses and Rydberg energies involved are moderately small, so that in contrast to Rydberg atoms the high field limit of Rydberg physics can be studied using fields strengths that can be realized in the lab. Here we investigate the effects of external magnetic fields of up to 7T on Rydberg excitons both in Faraday and Voigt geometry. In both cases complicated splitting patterns emerge. We investigate the differences between the two geometries and highlight spectroscopic features that are especially easy to access using them. We show that the large number of resonances in the spectrum renders a microscopic treatment of each individual resonance implausible. We instead demonstrate general effects introduced by the field like avoided crossings and discuss alternative approaches to the level structure in terms of collective descriptions.

Paper Details

Date Published: 27 February 2016
PDF: 7 pages
Proc. SPIE 9749, Oxide-based Materials and Devices VII, 97490K (27 February 2016); doi: 10.1117/12.2218532
Show Author Affiliations
J. Thewes, Technische Univ. Dortmund (Germany)
J. Heckötter, Technische Univ. Dortmund (Germany)
M. Aßmann, Technische Univ. Dortmund (Germany)
D. Fröhlich, Technische Univ. Dortmund (Germany)
P. Grünwald, Univ. Rostock (Germany)
S. Scheel, Univ. Rostock (Germany)
M. Bayer, Technische Univ. Dortmund (Germany)

Published in SPIE Proceedings Vol. 9749:
Oxide-based Materials and Devices VII
Ferechteh H. Teherani; David C. Look; David J. Rogers, Editor(s)

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