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Proceedings Paper

Generic heterogeneously integrated III-V lasers-on-chip with metal-coated etched-mirror
Author(s): Chee-Wei Lee; Doris Keh-Ting Ng; Min Ren; Yuan-Hsing Fu; Anthony Yew Seng Kay; Vivek Krishnamurthy; Jing Pu; Ai Ling Tan; Febiana Tjiptoharsono; Soo Bin Choo; Qian Wang
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Paper Abstract

We demonstrate electrically-pumped III-V quantum-well lasers bonded on SiO2 with a metal-coated etched-mirror. The metal-coated etched-mirror allow the lasers to be used as on-chip laser, but our process design make sure that it requires no additional fabrication step to fabricate the metal-coated etched mirror. The bonded III-V on SiO2 also permits tight laser mode confinement in the active region due to high index contrast between III-V and SiO2. Moreover, it promises a flexible choice of host substrate, in which the silicon substrate could also be replaced with other materials. The laser devices demonstrated have the lowest threshold of 50 mA, a maximum output power of 9 mW and a differential quantum efficiency of 27.6%.

Paper Details

Date Published: 3 May 2016
PDF: 8 pages
Proc. SPIE 9751, Smart Photonic and Optoelectronic Integrated Circuits XVIII, 97510M (3 May 2016); doi: 10.1117/12.2218395
Show Author Affiliations
Chee-Wei Lee, A*STAR - Institute of Materials Research and Engineering (Singapore)
Doris Keh-Ting Ng, A*STAR - Data Storage Institute (Singapore)
Min Ren, A*STAR - Data Storage Institute (Singapore)
Yuan-Hsing Fu, A*STAR - Data Storage Institute (Singapore)
Anthony Yew Seng Kay, A*STAR - Data Storage Institute (Singapore)
Vivek Krishnamurthy, A*STAR - Data Storage Institute (Singapore)
Jing Pu, A*STAR - Data Storage Institute (Singapore)
Ai Ling Tan, A*STAR - Data Storage Institute (Singapore)
Febiana Tjiptoharsono, A*STAR - Data Storage Institute (Singapore)
Soo Bin Choo, A*STAR - Data Storage Institute (Singapore)
Qian Wang, A*STAR - Data Storage Institute (Singapore)


Published in SPIE Proceedings Vol. 9751:
Smart Photonic and Optoelectronic Integrated Circuits XVIII
Sailing He; El-Hang Lee; Louay A. Eldada, Editor(s)

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