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Proceedings Paper

Bi/Si interface and Bi nanolines characterization by surface differential reflectivity
Author(s): Viktor V. Buchenko; Andrey A. Goloborodko
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Paper Abstract

The influence of Bi/Si(001) interfaces and Bi nanolines on Si(001) surface on the reflectance properties of two-phase systems is discussed in ultra-high vacuum, by means of two different surface optical spectroscopies: the Surface Differential Reflectance Spectroscopy and the Reflectance Anisotropy Spectroscopy. Specific spectra are obtained, which are interpreted as a function of the surface modification mode. In particular, it is possible to discriminate between Bi/Si interfaces with different thickness and Bi nanolines on Si surface. Moreover, quantitative information is proposed from these optical techniques which yields the determination of the number (or concentration) of surface Si and Bi atoms involved in the bonding.

Paper Details

Date Published: 30 November 2015
PDF: 7 pages
Proc. SPIE 9809, Twelfth International Conference on Correlation Optics, 98090N (30 November 2015); doi: 10.1117/12.2218069
Show Author Affiliations
Viktor V. Buchenko, National Taras Shevchenko Univ. of Kyiv (Ukraine)
Andrey A. Goloborodko, National Taras Shevchenko Univ. of Kyiv (Ukraine)


Published in SPIE Proceedings Vol. 9809:
Twelfth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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