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Proceedings Paper

The precision study of mark position after binarization for dynamic tests
Author(s): Guoce Hu; Jin Zhang; Huaxia Deng; Liandong Yu
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Paper Abstract

As a method of non-contact, binocular vision technique is important for vibration test. When measuring the vibrating objects, the frame rate of cameras must match the vibration frequency of the object. If the objects vibrate in high-frequency, it will lead massive image data. However, the speed of data transmission is limited by massive data. Thus, in order to deal with these data, data compression is inevitable before data transmission. Binarization is a simple and fast process to minimize the size of the image data. But the pixel locations of the marked points may change after binarization, which will inevitably affect the reconstruction of the marked points and further influence the precision of the measurement data. In this paper, the parameters which influence the position of various types of marked points are studied after binarization for dynamic test. A vibration table is employed to provide a standard moving motion. The frequency and amplitude is given by the controller of the vibration table. Three types of marked points, dot, circle and cross, are studied in this research. The obtained images in the dynamic test are minimized after binarization, and the pixel locations of the marked points are obtained. The change of pixel location is studied for the different types of the marked points with the comparison experiments and the precision of the reconstruction is investigated later.

Paper Details

Date Published: 26 January 2016
PDF: 12 pages
Proc. SPIE 9903, Seventh International Symposium on Precision Mechanical Measurements, 99032R (26 January 2016); doi: 10.1117/12.2218042
Show Author Affiliations
Guoce Hu, Hefei Univ. of Technology (China)
Jin Zhang, Hefei Univ. of Technology (China)
Huaxia Deng, Hefei Univ. of Technology (China)
Liandong Yu, Hefei Univ. of Technology (China)


Published in SPIE Proceedings Vol. 9903:
Seventh International Symposium on Precision Mechanical Measurements
Liandong Yu, Editor(s)

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