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Proceedings Paper

Laser bistatic two-dimensional scattering imaging simulation of lambert cone
Author(s): Yanjun Gong; Chongyue Zhu; Mingjun Wang; Lei Gong
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Paper Abstract

This paper deals with the laser bistatic two-dimensional scattering imaging simulation of lambert cone. Two-dimensional imaging is called as planar imaging. It can reflect the shape of the target and material properties. Two-dimensional imaging has important significance for target recognition. The expression of bistatic laser scattering intensity of lambert cone is obtained based on laser radar eauqtion. The scattering intensity of a micro-element on the target could be obtained. The intensity is related to local angle of incidence, local angle of scattering and the infinitesimal area on the cone. According to the incident direction of laser, scattering direction and normal of infinitesimal area, the local incidence angle and scattering angle can be calculated. Through surface integration and the introduction of the rectangular function, we can get the intensity of imaging unit on the imaging surface, and then get Lambert cone bistatic laser two-dimensional scattering imaging simulation model. We analyze the effect of distinguishability, incident direction, observed direction and target size on the imaging. From the results, we can see that the scattering imaging simulation results of the lambert cone bistatic laser is correct.

Paper Details

Date Published: 5 November 2015
PDF: 6 pages
Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 979529 (5 November 2015); doi: 10.1117/12.2217435
Show Author Affiliations
Yanjun Gong, Hunan Univ. of Science and Engineering (China)
Chongyue Zhu, Hunan Univ. of Science and Engineering (China)
Mingjun Wang, Xian Yang Normal College (China)
Lei Gong, Xi’an Technological Univ. (China)


Published in SPIE Proceedings Vol. 9795:
Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015
Shenggang Liu; Songlin Zhuang; Michael I. Petelin; Libin Xiang, Editor(s)

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