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Proceedings Paper

Development of a novel x-ray focusing technique using crystals with a two-dimensionally modulated surfaces
Author(s): William Z. Chang; Ernst-Bernhard Kley; Hans-Joerg Fuchs; Bernd Schnabel; Eckhart Foerster; Felix N. Chukhovskii
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Paper Abstract

Theoretical investigations for obtaining x-ray point focusing by using crystals with two- dimensionally modulated surfaces are carried out. Based on the Bragg and Fresnel diffraction principles, formulae of modulated surfaces (structures) are derived for both flat and bent crystals for focusing x rays to micron or submicron size. It is found that elliptically shaped and linearly modulated structures are suitable for flat and cylindrically bent crystals, respectively. For the given Ti K(alpha) radiation and geometric parameters, Si (111) and InSb (111) reflections are used for the calculations of flat and bent crystals in terms of their focus characteristics, namely the focusing efficiency and the focus width. The influence of the distribution of the Bragg amplitude on flat and bent crystals is also discussed.

Paper Details

Date Published: 25 September 1995
PDF: 8 pages
Proc. SPIE 2516, X-Ray Microbeam Technology and Applications, (25 September 1995); doi: 10.1117/12.221684
Show Author Affiliations
William Z. Chang, Friedrich-Schiller-Univ. Jena (Germany)
Ernst-Bernhard Kley, Friedrich-Schiller-Univ. Jena (Germany)
Hans-Joerg Fuchs, Friedrich-Schiller-Univ. Jena (Germany)
Bernd Schnabel, Friedrich-Schiller-Univ. Jena (Germany)
Eckhart Foerster, Friedrich-Schiller-Univ. Jena (Germany)
Felix N. Chukhovskii, Friedrich-Schiller-Univ. Jena (Germany)


Published in SPIE Proceedings Vol. 2516:
X-Ray Microbeam Technology and Applications
Wenbing Yun, Editor(s)

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