Share Email Print
cover

Proceedings Paper

Inverse problems biomechanical imaging (Conference Presentation)
Author(s): Assad A. Oberai

Paper Abstract

It is now well recognized that a host of imaging modalities (a list that includes Ultrasound, MRI, Optical Coherence Tomography, and optical microscopy) can be used to “watch” tissue as it deforms in response to an internal or external excitation. The result is a detailed map of the deformation field in the interior of the tissue. This deformation field can be used in conjunction with a material mechanical response to determine the spatial distribution of material properties of the tissue by solving an inverse problem. Images of material properties thus obtained can be used to quantify the health of the tissue. Recently, they have been used to detect, diagnose and monitor cancerous lesions, detect vulnerable plaque in arteries, diagnose liver cirrhosis, and possibly detect the onset of Alzheimer’s disease. In this talk I will describe the mathematical and computational aspects of solving this class of inverse problems, and their applications in biology and medicine. In particular, I will discuss the well-posedness of these problems and quantify the amount of displacement data necessary to obtain a unique property distribution. I will describe an efficient algorithm for solving the resulting inverse problem. I will also describe some recent developments based on Bayesian inference in estimating the variance in the estimates of material properties. I will conclude with the applications of these techniques in diagnosing breast cancer and in characterizing the mechanical properties of cells with sub-cellular resolution.

Paper Details

Date Published: 27 April 2016
PDF: 1 pages
Proc. SPIE 9710, Optical Elastography and Tissue Biomechanics III, 97100W (27 April 2016); doi: 10.1117/12.2216702
Show Author Affiliations
Assad A. Oberai, Rensselaer Polytechnic Institute (United States)


Published in SPIE Proceedings Vol. 9710:
Optical Elastography and Tissue Biomechanics III
Kirill V. Larin; David D. Sampson, Editor(s)

© SPIE. Terms of Use
Back to Top