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Proceedings Paper

Direct observation of microscopic inhomogeneities in high-Tc superconductors using energy-dispersive diffraction of synchrotron-produced xrays
Author(s): Earl F. Skelton; Syen B. Qadri; Michael S. Osofsky; A. R. Drews; P. R. Broussard; J. Z. Hu; L. W. Finger; Terrell A. Vanderah; D. Kaiser; J. L. Peng; Steven M. Anlage; Richard L. Greene; John Giapintzakis
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Paper Abstract

Evidence of micron-sized structural inhomogeneities in several high transition temperature (Tc) superconductors is presented. By illuminating samples with high energy, highly collimated x rays produced on a synchrotron wiggler, small changes in the lattice were detected over a spatial scale as small as 10 micrometer. In the YBa2Cu3O7-(delta ) crystals, these changes are interpreted as evidence of variations in the oxygen content and in the Nd2-xCexCuO4-y crystal, as a variation in the cerium content. Each type of inhomogeneity can affect the superconducting properties.

Paper Details

Date Published: 25 September 1995
PDF: 10 pages
Proc. SPIE 2516, X-Ray Microbeam Technology and Applications, (25 September 1995); doi: 10.1117/12.221669
Show Author Affiliations
Earl F. Skelton, Naval Research Lab. (United States)
Syen B. Qadri, Naval Research Lab. (United States)
Michael S. Osofsky, Naval Research Lab. (United States)
A. R. Drews, Naval Research Lab. (United States)
P. R. Broussard, Naval Research Lab. (United States)
J. Z. Hu, Carnegie Institute of Washington (United States)
L. W. Finger, Carnegie Institute of Washington (United States)
Terrell A. Vanderah, National Institute of Standards and Technology (United States)
D. Kaiser, National Institute of Standards and Technology (United States)
J. L. Peng, Univ. of Maryland/College Park (United States)
Steven M. Anlage, Univ. of Maryland/College Park (United States)
Richard L. Greene, Univ. of Maryland/College Park (United States)
John Giapintzakis, Univ. of Illinois/Urbana-Champaign (United States)


Published in SPIE Proceedings Vol. 2516:
X-Ray Microbeam Technology and Applications
Wenbing Yun, Editor(s)

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