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Proceedings Paper

Shearing interferometer for testing wavefront
Author(s): Stefan M. B. Baumer; Rainer Thieme
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Paper Abstract

Interferometric tests are widely used to test high precision optical systems. This kind of testing is about the only way to assure the desired accuracy and performance of those systems. In this paper a new lateral shearing interferometer (LSI) will be presented originally designed to test infinity corrected microscope objectives.

Paper Details

Date Published: 1 July 1990
PDF: 1 pages
Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.22165
Show Author Affiliations
Stefan M. B. Baumer, Optisches Institut (Germany)
Rainer Thieme, Optisches Institut (Germany)

Published in SPIE Proceedings Vol. 1319:
Optics in Complex Systems
F. Lanzl; H.-J. Preuss; G. Weigelt, Editor(s)

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