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Proceedings Paper

Errors analysis of dimensional metrology for internal components assembly of EAST
Author(s): Yongqi Gu; Chen Liu; Weibin Xi; Kun Lu; Jing Wei; Yuntao Song; Liandong Yu; Jian Ge; Yuanyang Zheng; Huining Zhao; Fubin Zheng; Jun Wang
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Paper Abstract

The precision of dimensional measurement plays an important role in guaranteeing the assembly accuracy of its internal components during the upgrading phase of EAST device. In this paper, the experimental research and analysis were done based on three dimensional combined measurement systems, combining Laser Tracker, flexible Measure ARM and measurement fiducials network, which are used for alignment and measurement of EAST components during the assembly process. The error sources were analyzed, e.g. temperature, gravity, welding, and so on. And the effective weight of each kind of error source was estimated by the simulation method. Then these results were used to correct and compensate the actual measured data, the stability and consistency of the measurement results was greatly improved in different measurement process, and the assembly precision of the EAST components was promised.

Paper Details

Date Published: 26 January 2016
PDF: 7 pages
Proc. SPIE 9903, Seventh International Symposium on Precision Mechanical Measurements, 99032F (26 January 2016); doi: 10.1117/12.2216480
Show Author Affiliations
Yongqi Gu, Institute of Plasma Physics (China)
Chen Liu, Institute of Plasma Physics (China)
Weibin Xi, Institute of Plasma Physics (China)
Kun Lu, Institute of Plasma Physics (China)
Jing Wei, Institute of Plasma Physics (China)
Yuntao Song, Institute of Plasma Physics (China)
Liandong Yu, Hefei Univ. of Technology (China)
Jian Ge, Institute of Plasma Physics (China)
Yuanyang Zheng, Institute of Plasma Physics (China)
Huining Zhao, Hefei Univ. of Technology (China)
Fubin Zheng, Institute of Plasma Physics (China)
Jun Wang, Institute of Plasma Physics (China)

Published in SPIE Proceedings Vol. 9903:
Seventh International Symposium on Precision Mechanical Measurements
Liandong Yu, Editor(s)

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