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Proceedings Paper

Laser plasma source of polarized monochromatic beams in the XUV around multilayer mirrors
Author(s): Eugene N. Ragozin; Nikolai N. Kolachevsky; Mikhail M. Mitropolsky; Yurii Yu. Pokrovsky; Alexander P. Shevelko; A. A. Vasil'ev; Yuriy Ya. Platonov; Nikolai N. Salashchenko
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Paper Abstract

Using soft x-ray multilayer mirrors (MMs) and a laser-plasma broadband radiation source, we have implemented a pulsed 0.5-Hz-repetition-rate source of polarized quasimonochromatic radiation in the XUV. The x-ray optical setup comprises a focusing MM at near-normal incidence, a plane polarizing MM at 41 degrees off axis, and a plane multilayer analyzer which can be rotated by 90 degrees with respect to the polarizer. A stigmatic broadband spectrometer comprising a grazing incidence toroidal mirror and a large-aperture (5 cm2) transmission grating (TG) has proved to be useful in spectroscopic characterization of plane multilayer mirrors and the laser-plasma source. The second (reference) x-ray optical channel comprises a focusing MM and serves to monitor the energy of individual pulses. The focusing MMs image the laser-plasma source onto the sodium-salicylate-covered surfaces of flexible 0.7-cm-long light guides 13 mm in diameter coupled through light-guide disks to photomultipliers outside the vacuum tank. The visible and VUV radiation outside the resonance reflection peak is rejected by free-standing Al filters placed before the detectors. The dimension of the x-ray source was measured at 100 microns (width at base) using a CCD array covered with sodium salicylate. The polarizance of the plane MM was measured at 98.2% while the peak theoretical value for this Mo-Si multilayer structure (2d equals 240 angstrom, N equals 25, lambdao equals 171.4 angstrom, 41 degrees off axis) is 98.75%. The polarized source yields of the order of 5 (DOT) 108 photons per pulse in the resonance reflection band of the MMs.

Paper Details

Date Published: 25 September 1995
PDF: 9 pages
Proc. SPIE 2520, Soft X-Ray Lasers and Applications, (25 September 1995); doi: 10.1117/12.221646
Show Author Affiliations
Eugene N. Ragozin, P.N. Lebedev Physical Institute (Russia)
Nikolai N. Kolachevsky, P.N. Lebedev Physical Institute (Russia)
Mikhail M. Mitropolsky, P.N. Lebedev Physical Institute (Russia)
Yurii Yu. Pokrovsky, P.N. Lebedev Physical Institute (Russia)
Alexander P. Shevelko, P.N. Lebedev Physical Institute (Russia)
A. A. Vasil'ev, P.N. Lebedev Physical Institute (Russia)
Yuriy Ya. Platonov, Institute for Physics of Microstructures (Russia)
Nikolai N. Salashchenko, Institute for Physics of Microstructures (Russia)


Published in SPIE Proceedings Vol. 2520:
Soft X-Ray Lasers and Applications
Jorge J. G. Rocca; Peter L. Hagelstein, Editor(s)

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