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Proceedings Paper

Methods of generating a hollow spot for STED microscopy
Author(s): Yun Xiao; Yunhai Zhang; Haomin Yang; Xin Zhang
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Paper Abstract

On the base of the vectorial diffraction theory, the diffraction integral represents are obtained to generate a hollow spot for STED. In the paper, the incident light is modulated by phase and polarization to focus a hollow spot. The 2-dimension hollow spot is obtained by modulating the circularly polarized beam with 0-2π vortex phase or 0/π circular phase. Addition In addition, we get the 2-dimension hollow spot by focusing azimuthally polarized beam or a radially polarized beam modulated with 0/π circular phase. The intensity distributions and size of these 2-dimension hollow spots are discussed. Then the 3-dimension hollow spot is got by taking advantage of two kinds of 2-dimension hollow spots. There are two methods to generate a hollow spot by the diffraction integral represents. One is modulating two circularly polarized beams with 0-2π vortex phase and 0/π circular phase respectively. The other is choosing an azimuthally polarized beam and a radially polarized beam modulated with 0/π circular phase as depletion beams. So we obtain a 2-dimension hollow spot by modulating a beam, and obtain a 3-dimension hollow spot by modulating two beams. These hollow spots can be useful for STED to realize 2-dimension and 3-dimension super-resolution.

Paper Details

Date Published: 5 November 2015
PDF: 9 pages
Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 97951Z (5 November 2015); doi: 10.1117/12.2216429
Show Author Affiliations
Yun Xiao, Suzhou Institute of Biomedical Engineering and Technology (China)
Yunhai Zhang, Suzhou Institute of Biomedical Engineering and Technology (China)
Haomin Yang, Suzhou Institute of Biomedical Engineering and Technology (China)
Xin Zhang, Suzhou Institute of Biomedical Engineering and Technology (China)


Published in SPIE Proceedings Vol. 9795:
Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015
Shenggang Liu; Songlin Zhuang; Michael I. Petelin; Libin Xiang, Editor(s)

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