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Proceedings Paper

The extended depth of field microscope imaging system with the phase pupil mask
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Paper Abstract

A ‘0/π’ phase pupil mask was developed to extend the depth of field of a circularly symmetric optical microscope imaging system. The modulation transfer function curves, the normalized point spread function figures and the spot diagrams of the imaging system with the optimal mask were analyzed and simulated. The results show that the large depth of field imaging system with the ‘0/π’ phase pupil mask has a high resolution in a long frequency band and can obtain clear images without any post-processing. The experimental results also demonstrate that the depth of field of the imaging system is extended successfully.

Paper Details

Date Published: 5 November 2015
PDF: 6 pages
Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 97951U (5 November 2015); doi: 10.1117/12.2216178
Show Author Affiliations
Qinghua Lyu, Hubei Univ. of Technology (China)
Zhongsheng Zhai, Hubei Univ. of Technology (China)
Martin Sharp, Liverpool John Moores Univ. (United Kingdom)
Paul French, Liverpool John Moores Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 9795:
Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015
Shenggang Liu; Songlin Zhuang; Michael I. Petelin; Libin Xiang, Editor(s)

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