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Proceedings Paper

Design and research of spectropolarimetric system based on Sagnac interferometer
Author(s): Tao Yu; Bingliang Hu; Zhoufeng Zhang; Xiaohui Gao; Ruyi Wei; Qijing Wu
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Paper Abstract

Spectral imaging technology has made great achievements in applications of earth observation and space target detection, with the further development of research, the requirement that People tend to get more material properties about target is also improving rapidly, so getting more characters of the target is continuous pursuit goal for the instruments of optical remote sensing. Polarization is one of the four main physical properties of light including intensity, frequency and phase . It has very important significance for remote sensing observations such as improving the accuracy of target recognition. This paper proposes on a spectropolarimeter system based on Sagnac interferometer, and introduces the main aspects related to System components, working principle, optical design, adaptive spectrum extraction algorithm, state of polarization extraction methods. Also get the data of polarization spectral imaging by using the instruments designed by the principle .By processing these data I have got the combined polarization image and target spectral curves, achieved a good result. It is a new attempt to obtain polarization spectral image by integrated measuring system. Then thoroughly solve the traditional shortcoming of spectropolarimeter, such as asynchronous detecting, poor stability and vibration, poor energy efficiency. It can be applied to many kinds of fields. Simultaneously the paper puts forward some relevant new points in the future research for this kind of principle.

Paper Details

Date Published: 5 November 2015
PDF: 6 pages
Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 97951R (5 November 2015); doi: 10.1117/12.2216127
Show Author Affiliations
Tao Yu, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Bingliang Hu, Xi'an Institute of Optics and Precision Mechanics (China)
Zhoufeng Zhang, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Xiaohui Gao, Xi'an Institute of Optics and Precision Mechanics (China)
Ruyi Wei, Xi'an Institute of Optics and Precision Mechanics (China)
Qijing Wu, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 9795:
Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015
Shenggang Liu; Songlin Zhuang; Michael I. Petelin; Libin Xiang, Editor(s)

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