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Proceedings Paper

Basic use of acoustic speckle pattern for metrology
Author(s): Duo-Min He
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Paper Details

Date Published: 1 July 1990
PDF: 3 pages
Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.22153
Show Author Affiliations
Duo-Min He, East China Institute of Technology (China)


Published in SPIE Proceedings Vol. 1319:
Optics in Complex Systems

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