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Proceedings Paper

Optical measurements of the mutual reflection of two plane shock waves
Author(s): Filipe Jose Barbosa; Beric W. Skews
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Paper Abstract

A bifurcated shock tube is used to create two synchronized waves of equal strength. Essentially a single shock wave is split symmetrically in two, the two waves then are later brought back together at a trailing edge of a wedge to interact, the plane of symmetry acting as an ideal rigid wall. The normal method of studying Mach reflections is to allow a plane shock wave to impinge on a wedge, however the boundary layer growth on the wedge surface effectively ensures that the flow direction behind the Mach stem does not have to satisfy the boundary condition of being parallel to the surface of the wedge. Thus the transition from regular to Mach reflection occurs at higher angles of incidence than theory allows. The present experiment was initiated to generate data on the 'ideal' case of reflection off a plane wall. The advantage of the new system is that like classical theory and computational solutions of the inviscid Euler equations, the boundary layer no slip condition is not imposed at the plane of reflection. Optical methods ar used to investigate the post-shock flows, as well as to help explain the complex interactions which occur when the two shock waves are not synchronized. These interactions show many very interesting features and clearly indicate the need for higher resolution measurements such as are obtained using holographic interferometry, and also to extend the work to different wedge angles and Mach numbers.

Paper Details

Date Published: 29 September 1995
PDF: 9 pages
Proc. SPIE 2546, Optical Techniques in Fluid, Thermal, and Combustion Flow, (29 September 1995); doi: 10.1117/12.221525
Show Author Affiliations
Filipe Jose Barbosa, Univ. of the Witwatersrand (South Africa)
Beric W. Skews, Univ. of the Witwatersrand (South Africa)

Published in SPIE Proceedings Vol. 2546:
Optical Techniques in Fluid, Thermal, and Combustion Flow
Soyoung Stephen Cha; James D. Trolinger, Editor(s)

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